• XJP-500
XJP-500
+
XJP-500
+
  • XJP-500

XJP-500

XJP-500 series metallurgical microscope has excellent imaging performance and comfortable operating , it provides customers with cost-effective solutions for metallographic analysis and industrial inspection. The improved long working distance metallurgical objective improvesthe chromatic aberration correction level and further improves the image resolution and color reducibility. The instrument adopts reflection and transmission lighting methods. It can observe bright field, dark field, DiC and Polarization under reflection illumination, and Bright field observation under transmission illumination.


XJP-500

XJP-500 series metallurgical microscope has excellent imaging performance and comfortable operating , it provides customers with cost-effective solutions for metallographic analysis and industrial inspection. The improved long working distance metallurgical objective improvesthe chromatic aberration correction level and further improves the image resolution and color reducibility. The instrument adopts reflection and transmission lighting methods. It can observe bright field, dark field, DiC and Polarization under reflection illumination, and Bright field observation under transmission illumination.

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  • Product Description
  • Product Catalog
    • Commodity name: XJP-500

    XJP-500 series metallurgical microscope has excellent imaging performance and comfortable operating , it provides customers with cost-effective solutions for metallographic analysis and industrial inspection. The improved long working distance metallurgical objective improvesthe chromatic aberration correction level and further improves the image resolution and color reducibility. The instrument adopts reflection and transmission lighting methods. It can observe bright field, dark field, DiC and Polarization under reflection illumination, and Bright field observation under transmission illumination.

    XJP-500
    Series metallurgical microscope

    Specification   Model
    XJP-500 XJP-500F XJP-500J XJP-500JF
    Optical system Infinite optical system
    Viewing Head Compensation Free trinocular Head inclined at 30°,interpuillary distance adjustable 50mm-75mm
    Eyepiece 1.Wide field Plan WF10X/22mm
    2.WF10×/20mm,crosshair with reticule 0.1mm
    Objective Long working distance bright field Infinite
    Plan objectives 5X/0.12(W.D=23.6mm)、
    10X/0.25(W.D.=17.8mm)、20X/0.40
    (W.D.=10.4mm)、50X/0.55(W.D.=7.0mm)
    (Option:100X/0.80(W.D.=3.2mm))
         
    Long working distance bright field Infinite
    Plan APO objectives:5X/0.14(W.D=12mm)、
    10X/0.30(W.D=11.0mm)、20X/0.46
    (W.D=4.0mm)、50X/0.80(W.D.=1.62mm)
         
    Long working distance bright and dark field
    Infinite Plan objectives: 5x/0. (W.D.=23.6mm)、
    10X/0.25(W.D=17.8mm)、
    20X/0.40(W.D=10.4mm)、50X/0.55
    (W.D,=7.0mm)
    (Option:100X/0.80(W.D=3.2mm))
         
    Long working distance bright and dark field
    Infinite Plan APO objectives: 5X/0.14
    (W.D.=12mm)、10X/0.30(W.D=11.0mm)、
    20X/0.46(W.D=4.0mm)、50X/0.80
    (W.D.=1.62mm)
         
    Nosepiece Quadruple nosepiece with DIC Jack    
    Stage Double layers mechanical stage
    Stage Size: 189X160mm
    Moving Range: 80mm×50mm
    Focusing 1.Coaxial coarse & fine focusing adjustment
    with rack and pinion mechanism
    2.Fine focusing scale value 0.002mm

     

    XJP-500

    Seriesmetallurgical microscope

    Specification   Model
    XJP-500 XJP-500F XJP-500J XJP-500JF
       
    Light Source
    Reflecting illumination:
    Kohler illumination with aperture iris
    diaphragm and field iris diaphragm
    Halogen Bulb 12V/50W,AC85V-230V,
    Brightness adjustable
    Transmitted illumination:
    Kohler illumination with aperture iris
    diaphragm andfield iris diaphragm
    Halogen Bulb 12V/50W,
    AC85V-230V, Brightness adjustable
    Polarizing Device Analyzer rotatable 360°, Polarizer & Analyzer
    can be moved out of the optical path
    Filter Green, Blue, Neutral
    Checking Tool 0.01mm Micrometer
    Optional Accessory 1.Eyepiece: WF15X/Φ17mm、WF20X/Φ12.5mm
    2.Differential interference(DIC)Device
    3.Photography attachment and CCD C-mount
    0.35X、0.5X、0.63X、0.75X、1X
    4.Two-dimensional measurement software
    5.Metallurgical image analysis software
    6.Micrometer eyepiece
    7.Various Industrial Camera
    8.Planishing tool
    9.2x Photo adaptor,varous types of Camera interface

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